EEC696:Digital System Testing and Testable Design
Sun, 12/12/2010 - 11:08 | 
admin
Code:
EEC696
Title:
Digital System Testing and Testable Design
Credits:
3
Degree:
Doctor
Master
Specialization:
Computer Electronics and Communications
Elective Course:
Elective
Modeling- Logic Simulation- Fault Modeling- Fault Simulation- Bridging Faults- Stuck-at Faults - Functional Testing - Design for Testability - Test Compression Techniques - PLA Testing - Built-In Self-Test - Logic-Level Fault Diagnosis - System-Level Fault Diagnosis.
